It’s a big week in Boston for NFC and RFID technology. On Thursday, the MIT Enterprise Forum will host the 4th Annual Auto-ID and Sensing Solutions Expo at the MIT Media Lab. This year the event is running in tandem with the NFC Bootcamp, a two-day educational event that begins on Wednesday.
The Auto-ID & Sensing Expo runs from 4-10 p.m. and features two panel discussions and more than 60 RFID and NFC exhibitors. The first panel discussion, “Taming the Chaos of People, Things & Places,” will include Daniel Bailin, a director wit HID Global, Enu Waktola, vice president at Smartrac, and Jason Weiss, chief software architect at Tag Dynamics.
Dr. Sanjay Sarma, co-founder of the MIT Auto-ID Center and chairman of the board for GS1 EPCglobal, will participate in a panel called “The Cloud of Things and Pervasive Sensor Networks.” Sarma will be joined by Rahul Bhattacharyya, an associate director at MIT’s Auto-ID Labs.
The Expo’s 60 exhibitors will include three of the world’s top RFID chip makers, four of the world’s top RFID label makers, and the largest printer company in the world for bar codes and RFID.
The NFC Bootcamp introduces companies to the world of NFC, its capabilities, uses, best practices, infrastructures and platforms to successfully market to the smartphone-savvy consumer.